Atomic Force Microscope (AFM): Exploring the Surface at the Nanoscale
Overview
An Atomic Force Microscope (AFM) is a high-resolution instrument used to measure and image surfaces at the nanoscale. It works by “feeling” the surface of a sample with a fine mechanical probe, enabling the visualization of structures at resolutions far beyond the limits of optical microscopy. AFM provides three-dimensional topographic information and can analyze a wide range of materials — from hard metals to soft biological tissues.
Unlike traditional microscopes that use light or electrons, AFM relies on physical interaction between a tiny tip and the sample surface, allowing it to achieve atomic-level precision.
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